ITE Equipment
Equipment |
Description |
Dept |
Contact |
Keywords |
---|---|---|---|---|
IT200LV SEM (JEOL) |
SEM with EDX |
Technology Development Centre |
General enquiry
|
SEM, EDX |
UAG-IC Univeral Tester(Shimadzu) |
100kN Tensile Tester |
Technology Development Centre |
General enquiry
|
Tensile tester |
Q20 DSC (TA) |
Differential Scanning Calorimetry |
Technology Development Centre |
General enquiry
|
DSC |
Q400 TMA (TA) |
Thermo Mechanical Analyser |
Technology Development Centre |
General enquiry
|
TMA |
Q50 TGA (TA) |
Thermogravimetry Gravimetry Analyser |
Technology Development Centre |
General enquiry
|
TGA |
DMA1 (METTLER TOLEDO) |
Dynamic Mechanical Analyser |
Technology Development Centre |
General enquiry
|
DMA |
HMV-G20S (SHIMADZU) |
Micro Vickers Hardness Tester |
Technology Development Centre |
General enquiry
|
Vickers Micro Hardness |
DAGE 5000 (DAGE) |
Bond tester for microelectronics. Wire bond pull test, ball shear, die shear |
Technology Development Centre |
General enquiry
|
Ball bond tester, wire bond pull tester, die shear tester |
HI5522 (HANNA) |
pH meter, electrical conductvity tester |
Technology Development Centre |
General enquiry
|
pH meter, electrical conductivity tester |
VISCOQC 100 (ANTON PARR) |
Rotational viscometer |
Technology Development Centre |
General enquiry
|
Viscometer |
XD 6600 X-RAY (DAGE) |
X-ray inspection system |
Technology Development Centre |
General enquiry
|
X-ray |
EDDY CURRENT ELECTRICAL CONDUCTIVITY METER (FOERSTER) |
Electrical conductivity meter for non ferrous metal |
Technology Development Centre |
General enquiry
|
Electrical conductivity meter |
STM-6 MEASUREING MICROSCOPE (OLYMPUS) |
Tool maker measuring microscope |
Technology Development Centre |
General enquiry
|
measuring microscope |
TCC-150W (ESPEC) |
Temperature Cycling Chamber |
Technology Development Centre |
General enquiry
|
temperature cycling chamber, reliability |
SH-222 (ESPEC) |
Temperature humidity chamber |
Technology Development Centre |
General enquiry
|
temperature humidity chamber, reliability |
PC-242HS-A/V (HIRAYAMA) |
Pressure cooker test chamber, 121 degC, 100%RH, 2atm, |
Technology Development Centre |
General enquiry
|
PCT, reliability |
MAT6400 (MAT) |
Flip chip bonder |
Technology Development Centre |
General enquiry
|
flip chip bonder, semicon |
BM-W630 (DEKTEC) |
6-zone reflow oven |
Technology Development Centre |
General enquiry
|
reflow oven, semicon |
AM410 (ANT SCIENTIFIC) |
Planetary Ball miller |
Technology Development Centre |
General enquiry
|
planetary ball miller |
J35 PRO (STRATASYS) |
3D printer |
Technology Development Centre |
General enquiry
|
3d printer |
MILLING MACHINE |
Milling machine for fabrication |
Technology Development Centre |
General enquiry
|
milling, drilling, fabrication |
METAL-X (MARKFORGE) |
Metal 3D printer |
Technology Development Centre |
General enquiry
|
metal 3d printer |